MA509 Eyepiece Micrometer, 5mm divided into 100 units

MA509 Eyepiece Micrometer, 5mm divided into 100 units. Microscope micrometers are commonly used for measuring or counting specimens. Eyepiece micrometers (also referred to as "reticles") are small glass discs with markings on them.

Made In Japan


Locate a DealerGet a Quote


isorohs



The micrometer is mounted in one of the two eyepieces and superimposes an image of the markings over the image of the specimen. Stage micrometers are slides with markings of a known dimension that, when viewed under the microscope, can be used to calibrate eyepiece micrometers. 5mm divided into 100 units, 25mm diameter

Details

 

Microscope micrometers are commonly used for measuring or counting specimens. Eyepiece micrometers (also referred to as "reticles") are small glass discs with markings on them. The micrometer is mounted in one of the two eyepieces and superimposes an image of the markings over the image of the specimen. Stage micrometers are slides with markings of a known dimension that, when viewed under the microscope, can be used to calibrate eyepiece micrometers.

Calibration

Since the size of the eyepiece micrometer image (e.g. a linear scale) appears the same even though the specimen can be magnified to a greater or lesser degree, the markings on the micrometer do not by themselves indicate any particular measurement. When a stage micrometer with known dimensions is viewed through an eyepiece micrometer, however, the measurement indicated by the eyepiece micrometer at that magnification can be noted and later used to make accurate measurements.microscope micrometer

 

Eyepiece Micrometers 

Dimensions given are the actual size of the markings on the micrometer disc. Eyepieces for our various models require micrometers of different diameter. The model numbers listed below refer to microscopes with standard 10x eyepieces. If you are using optional eyepieces of a different magnification and do not see them listed, contact us to find out the correct size.

25mm Diameter Micrometers for RZ Series 10x eyepieces
25mm Diameter Micrometers for EM Series 10x eyepieces
25mm Diameter Micrometers for MT5000, MT6000 Series 10x eyepieces
25mm Diameter Micrometers for TC5000, IM7000 Series 10x eyepieces

 

Part Number
Description
MA523

Cross-line reticle

MA506
Linear scale, 10mm divided into 100 units
MA509
Linear scale, 5mm divided into 100 units
MA510
Counting grid, 10mm square divided into 100 1mm squares
MA524
Counting grid, 10mm square divided into 400 0.5mm squares
MA542
Cross-line with 0.1 mm graduations
MA738
Grain Sizing Reticle for Steel

 

 

21mm Diameter Micrometers for ML2000, ML5000, ML7000, ML7500, ML8000, ML8500, MT4000 and MT9000 Series 10x eyepieces

 

Part Number

Description
MA284 Cross-line reticle, 21mm diameter, 1mm thickness, 25 micron line width
MA255 Linear scale, 10mm divided into 100 units
MA256 Linear scale, 5mm divided into 100 units
MA283/05 Counting grid, 10mm square divided into 100 1mm squares
MA540 Cross-line with 0.1 mm graduations
MA254/05 Walton & Beckett reticle, 21 mm diameter

 

 

19mm Diameter Micrometers for RZ Series 15x and 20x eyepieces, and all TM200 and TM400 Series eyepieces 

 

Part Number

Description
MA279 Cross-line reticle
MA223 Linear scale, 0.5" divided into 50 units
MA280 Linear scale, 10mm divided into 100 units
MA281 Linear scale, 5mm divided into 100 units
MA282 Counting grid, 10mm square divided into 400 0.5mm squares
MA283 Counting grid, 10mm square divided into 100 1.0mm squares
MA253 Cross-line with dotted lines
MA539 Cross-line with 0.1 mm graduations
MA254 Walton & Beckett reticle

 

STAGE MICROMETERS

 

Part Number
Description
MA285

Linear scale, 1mm divided into 0.01mm units, for transmitted light

MA292 Linear scale, 1mm divided into 0.01mm units, for reflected light (metal)
MA286 Linear scale, 0.4" divided into 0.001" units, for transmitted light
MA287 Counting grid, 0.2mm square into 400 0.01mm squares, for transmitted light
MA187 Linear scale, 10mm divided into 100 units, 0.1mm
MA186 Stage micrometer for checking alignment of stereo microscopes